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From Gaussian Beams to Top-hat Beams Z-scan:Analysis of Sensitivity and Reliability(PDF)

《南京师大学报（自然科学版）》[ISSN:1001-4616/CN:32-1239/N]

Issue:
2009年01期
Page:
43-46
Research Field:
物理学
Publishing date:

Info

Title:
From Gaussian Beams to Top-hat Beams Z-scan:Analysis of Sensitivity and Reliability
Author(s):
Zuo Ping; Gu Bing; Tan Suqing; Huang Xiaoqin
Jiangsu Key Laboratory on Opto-Electronic Technology,School of Physics Science and Technology,Nanjing Normal University,Nanjing 210097,China
Keywords:
Z-scan;  sensitiv ity;  reliability;  near top-ha t beam s
PACS:
TN241
DOI:
-
Abstract:
The norma lized transm ittance of Z-scan traces, by using the fast Fourier Transfo rm ( FFT) me thod, was analyzed. The in fluence o f the spatia l pro file beam o f input lase r on the sens itiv ity and re liab ility in Z-scan m easurem en ts w as discussed in de tai.l The c lip Gaussian beam s ( .i e. , near top-ha t beam s) Z-scan technique, wh ich im proves the sensitiv ity, the re liab ility o f measurem ents, and the efficiency in use of the input laser energy w as presented.

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Last Update: 2013-04-23