|Table of Contents|

Asymmetry Parameter of the Z-Scan Traces Using Top-Hat Laser Beam(PDF)

《南京师大学报(自然科学版)》[ISSN:1001-4616/CN:32-1239/N]

Issue:
2007年02期
Page:
42-46
Research Field:
物理学
Publishing date:

Info

Title:
Asymmetry Parameter of the Z-Scan Traces Using Top-Hat Laser Beam
Author(s):
Pan WenTao HongGu Bing
School of Physical Science and Technology,Nanjing Normal University,Nanjing 210097,China
Keywords:
non linear optics Z-scan technique asymm etry param eter non linear refraction
PACS:
O437
DOI:
-
Abstract:
The re la tionsh ip of the asymm e try param eterA, w hich is the ratio of the re lative m agn itudes of the peak and va lley for theZ-scan traces using top-hat spatia l pro file beam, w ith the linear transm ittance o f the far-fie ld ape rture S and the th ird-order non linear refractiv e phase shift φ 1, w as investig ated in de ta i.l For the Kerr op tica l non linear medium A = 1, imp ly ing that the re la tivem agnitude of va lley is equa l to the peak’ s, is independence o f φ 1 a tS = 0.156. Tak ing this pa rticularly v alue S, it is easy to norm a l ize the Z-scan traces from the exper im enta l v iewpo int. The influence o f the high order non linear ity on A w as also analyzed. A new m ethod, wh ich could iden tify whether the sam ple exh ibits the higher-orde r non linearity o r not and its sign from a single top-ha tZ-scan trace, was introduced.

References:

[ 1]  顾兵. 三阶非线性光学材料及其表征技术研究进展[ J] . 应用光学, 2003, 24( 6): 35-37.
[ 2]  BahaeM S, Sa id A A, W e i T H, et a.l Sensitive m easurem ent o f optica l non linear ities using a sing le beam [ J]. IEEE J Quant E lec tron, 1990, 26( 4): 760-769.
[ 3]  Gu B, W angY H, PengX C, e t a.l G iant optical non linea rity o f aB i2Nd2 Ti3O12 ferroelectr ic th in film [ J]. Appl Phys Lett,2004, 85( 17): 3 687-3 689.
[ 4]  Guo S L, Gu B, Zhang T. Th ird-order non linear ities and optical lim iting o f C60 po lyurethane-urea [ J]. J Nonlinea rOpt Phy s M a ter, 2004, 13( 1): 45-54.
[ 5]  ZhaoW, Pa lffy-M uhoray P. Z-scan technique using top-hat beam s [ J]. Appl Phys Lett, 1993, 63( 12): 1 613-1 615.
[ 6]  Gu B, Jun Y, W ang Q, e t a.l Z-scan techn ique for character iz ing th ird-order optical nonlinea rity by use o f quasi-one-d imen-sional silt beams [ J]. J Opt Soc Am B, 2004, 21( 5): 968-972.
[ 7]  Br idg es R E, F ischer G L, Boyd R W. Z-scan m easurement technique for non-Gaussian beam s and a rbitra ry sam ple th ick-nesses [ J]. Opt Le tt, 1995, 20( 17) : 1 821-1 823.
[ 8]  W ang Y, Saffm anM. Expe rim en tal study of nonlinear focusing in a magneto-optica l trap using aZ-scan techn ique [ J]. Phy s Rev A, 2004, 70: 013801-1-013801-9.
[ 9]  B iandra K S, Oak SM, Rustag iK C. Intensity dependence o fZ-scan in sem iconductor-doped glasses fo r separation of th ird and fifth o rder contributions in the be low band gap reg ion [ J]. Op t Commun, 1999, 168( 1 /4) : 219-225.
[ 10]  L iu Z B, ZangW P, T ian J G, et a.l Ana lysis o f Z-scan o f thick m ediaw ith high-orde r nonlinearity by var ia tiona l approach[ J]. Opt Commun, 2003, 219( 1 /6) : 411-419.
[ 11]  Tsig aridas G, Fak isM, Po lyzos I, e t a.l Z-scan ana ly sis for h igh non linear ities through Gaussian decomposition [ J]. OptComm un, 2003, 225( 4 /6): 253-268.
[ 12]  Gu B, Peng X C, Jia T, et a.l Dete rm ina tions o f th ird-and fifth-order non linear ities by the use of top-hat-beam Z-scan: theory and experim ent [ J]. J Opt SocAm B, 2005, 22( 2): 446-452.
[ 13] Gu B, Chen J, Fan Y X, e t a .l Theory o fGaussian beam Z-scan w ith simu ltaneous third-and fifth-order non linea r refraction based on aG aussian decomposition me thod [ J] . J Opt Soc Am B, 2005, 22( 12): 2 651-2 659.
[ 14]  BornM, W o lf E. Pr incip le o f Optics [M ]. 6 th ed. U K Oxfo ld: Pergamon, 1980.

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Last Update: 2013-05-05